- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 15/00 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
Patent holdings for IPC class G01B 15/00
Total number of patents in this class: 497
10-year publication summary
46
|
37
|
50
|
35
|
49
|
41
|
32
|
19
|
17
|
7
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Hitachi High-Technologies Corporation | 2034 |
84 |
Hitachi High-Tech Corporation | 4424 |
40 |
KLA-Tencor Corporation | 2574 |
14 |
Samsung Electronics Co., Ltd. | 131630 |
9 |
Advantest Corporation | 1939 |
9 |
Precision Planting LLC | 925 |
9 |
Siemens AG | 24990 |
7 |
The Boeing Company | 19843 |
7 |
ASML Netherlands B.V. | 6816 |
7 |
Applied Materials Israel, Ltd. | 549 |
5 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
5 |
Shimadzu Corporation | 5791 |
5 |
Arcam AB | 204 |
5 |
General Electric Company | 18133 |
4 |
Robert Bosch GmbH | 40953 |
4 |
EcoFactor, Inc. | 46 |
4 |
KLA Corporation | 1223 |
4 |
Baker Hughes Holdings LLC | 3060 |
4 |
NEC Corporation | 32703 |
3 |
Applied Materials, Inc. | 16587 |
3 |
Other owners | 265 |